搜索包含 Seminar on Fourier Analysis (1983 : Escorial) 的图书 - 暨南大学图书馆

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	Applications of digital image processing VI : August 23-26, 1983, San Diego, California 0 索取号：TN27-53/E804/6 作者：出版社：California Bellingham, Wash., USA : SPIE-the International Society for Optical Engineering, 1983.		Public management reform : a comparative analysis 0 索取号：D523/E20011 作者：Pollitt、 Christopher.、Bouckaert、 Geert.、出版社：Oxford [UK] ; New York : Oxford University Press, 2000.
	Multiresolution image processing and analysis 0 索取号：TN27/E903 作者：出版社：Berlin ; New York : Springer-Verlag, 1984.		Image processing : February 24-26, 1976, Asilomar Conference Center, Pacific Grove, California 0 索取号：TN27-53/E803 作者：Spie Seminar on Image Processing、 Asilomar Conference Center、 1976.、Urbach、 John C.、Optical Society of America.、Society of Photo-Optical Instrumentation Engineers.、出版社：[Palos Verdes Estates, Calif.] : SPIE, 1976.
	Proceedings of the Workshop on Picture Data Description and Management, August 27-28, 1980, Asilomar, Calif 0 索取号：TN27-53/E904/1980 作者：Workshop on Picture Data Description and Management (1980 : Asilomar、 Calif.)、IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis.、出版社：New York IEEE Los Alamitos, CA : The Society, c1980.		Digital logic circuit analysis and design 0 索取号：TN79/E991 作者：出版社：Beijing Tsinghua University Press 1998
	Analysis of biological development 0 索取号：Q11/E991 作者：Kalthoff、 Klaus.、出版社：New York : McGraw-Hill, c1996.		Techniques of financial analysis : a modern approach 0 索取号：F810/E998.9 作者：Helfert、 Erich A.、出版社：Chicago : Irwin Professional Pub., c1997.
	Practical algorithms for image analysis : description, examples, and code 0 索取号：TP391.41/E992 作者：Seul、 Michael.、O'Gorman、 Lawrence.、Sammon、 Michael J.、出版社：New York : Cambridge University Press, 1999.		Discrete Fourier transformation and its applications to power spectra estimation 0 索取号：TN1/E906 作者：GȩЦkinli、 Nezih C.、 1948-、Yavuz、 Davras、 1942-、出版社：Amsterdam ; New York : Elsevier, 1983.
	Rational fault analysis 0 索取号：TN106/E802 作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、出版社：New York : M. Dekker, 1977.		Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope 0 索取号：TN153-53/E804/1974 作者：Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、出版社：Chicago Ill. : IIT Research Institute, 1973.
	The infrared handbook 0 索取号：TN21-62/E801 作者：Environmental Research Institute of Michigan. Infrared Information and Analysis (IRIA) Center.、Wolfe、 William L.、Zissis、 George John、 1922-、United States. Office of Naval Research.、出版社：Washington : The Office, 1978.		Numerical analysis for semiconductor devices 0 索取号：TN303/E903 作者：Kurata、 Mamoru.、出版社：Lexington, Mass. : Lexington Books, c1982.
	NASECODE III : proceedings of the third International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits, held in Galway, Ireland from 15th to 17th June, 1983 0 索取号：TN303-53/E902/3 作者：NASECODE Conference (3rd : 1983 : Galway、 Ireland)、Miller、 John J. H.、Commission of the European Communities.、出版社：Dublin : Boole Press, 1983.		NASECODE V [electronic resource] : proceedings of the Fifth International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits : 17-19 June 1987, Trinity College, Dublin, Ireland 0 索取号：TN303-53/E902/5 作者：NASECODE Conference (5th : 1987 : Trinity College、 Dublin、 Ireland)、IEEE Xplore (Online service)、Miller、 John J. H.、出版社：Dún Laoghaire : Boole, 1987

	Applications of digital image processing VI : August 23-26, 1983, San Diego, California 0 索取号：TN27-53/E804/6 作者：出版社：California Bellingham, Wash., USA : SPIE-the International Society for Optical Engineering, 1983.		Public management reform : a comparative analysis 0 索取号：D523/E20011 作者：Pollitt、 Christopher.、Bouckaert、 Geert.、出版社：Oxford [UK] ; New York : Oxford University Press, 2000.
	Multiresolution image processing and analysis 0 索取号：TN27/E903 作者：出版社：Berlin ; New York : Springer-Verlag, 1984.		Image processing : February 24-26, 1976, Asilomar Conference Center, Pacific Grove, California 0 索取号：TN27-53/E803 作者：Spie Seminar on Image Processing、 Asilomar Conference Center、 1976.、Urbach、 John C.、Optical Society of America.、Society of Photo-Optical Instrumentation Engineers.、出版社：[Palos Verdes Estates, Calif.] : SPIE, 1976.
	Proceedings of the Workshop on Picture Data Description and Management, August 27-28, 1980, Asilomar, Calif 0 索取号：TN27-53/E904/1980 作者：Workshop on Picture Data Description and Management (1980 : Asilomar、 Calif.)、IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis.、出版社：New York IEEE Los Alamitos, CA : The Society, c1980.		Digital logic circuit analysis and design 0 索取号：TN79/E991 作者：出版社：Beijing Tsinghua University Press 1998
	Analysis of biological development 0 索取号：Q11/E991 作者：Kalthoff、 Klaus.、出版社：New York : McGraw-Hill, c1996.		Techniques of financial analysis : a modern approach 0 索取号：F810/E998.9 作者：Helfert、 Erich A.、出版社：Chicago : Irwin Professional Pub., c1997.
	Practical algorithms for image analysis : description, examples, and code 0 索取号：TP391.41/E992 作者：Seul、 Michael.、O'Gorman、 Lawrence.、Sammon、 Michael J.、出版社：New York : Cambridge University Press, 1999.		Discrete Fourier transformation and its applications to power spectra estimation 0 索取号：TN1/E906 作者：GȩЦkinli、 Nezih C.、 1948-、Yavuz、 Davras、 1942-、出版社：Amsterdam ; New York : Elsevier, 1983.
	Rational fault analysis 0 索取号：TN106/E802 作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、出版社：New York : M. Dekker, 1977.		Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope 0 索取号：TN153-53/E804/1974 作者：Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、出版社：Chicago Ill. : IIT Research Institute, 1973.
	The infrared handbook 0 索取号：TN21-62/E801 作者：Environmental Research Institute of Michigan. Infrared Information and Analysis (IRIA) Center.、Wolfe、 William L.、Zissis、 George John、 1922-、United States. Office of Naval Research.、出版社：Washington : The Office, 1978.		Numerical analysis for semiconductor devices 0 索取号：TN303/E903 作者：Kurata、 Mamoru.、出版社：Lexington, Mass. : Lexington Books, c1982.
	NASECODE III : proceedings of the third International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits, held in Galway, Ireland from 15th to 17th June, 1983 0 索取号：TN303-53/E902/3 作者：NASECODE Conference (3rd : 1983 : Galway、 Ireland)、Miller、 John J. H.、Commission of the European Communities.、出版社：Dublin : Boole Press, 1983.		NASECODE V [electronic resource] : proceedings of the Fifth International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits : 17-19 June 1987, Trinity College, Dublin, Ireland 0 索取号：TN303-53/E902/5 作者：NASECODE Conference (5th : 1987 : Trinity College、 Dublin、 Ireland)、IEEE Xplore (Online service)、Miller、 John J. H.、出版社：Dún Laoghaire : Boole, 1987